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TSMC, along with research teams like imec, continues to push the boundaries in pursuit of optimal solutions for achieving high bandwidth and low power consumption on the same chip area.
As per a report from Commercial Times, Imec has even mapped out a blueprint for the Angstrom era, with the potential to surpass the A1 threshold by 2040. They have also revealed that the A14 node will require the adoption of High-NA EUV (Extreme Ultraviolet Lithography with High Numerical Aperture), reportedly hinting that TSMC’s adoption of High-NA EUV is inevitable.
Per another report from the Economic Daily News, Luc Van den hove, President and CEO of imec, presented imec’s latest technological roadmap at the ITF Taiwan 2024 forum. He outlined plans to advance to the 2nm node by 2025, enter the angstrom era with the A14 process by 2027, and reach the A2 process by 2037.
He also explained the changes in imec’s transistor architecture, stating that the 2nm process will transition from FinFET to Nanosheet architecture, while the A7 process will further shift to complementary FET (CFET) architecture.
This, per Commercial Times’ report, hints that TSMC’s adoption is only a matter of time. TSMC emphasized that whenever new structures and tools, such as High-NA EUV, emerge, they carefully evaluate their maturity, costs, schedules, and feasibility.
Min Cao, Vice President of R&D at TSMC, pointed out that the performance, power, and area (PPA) gains from field-effect transistors (FETs) are diminishing. To sustain high growth, TSMC does not rule out the development of emerging materials.
He further expressed optimism about the significant growth wave driven by artificial intelligence, noting that the complexity of AI models and computational power is expected to grow exponentially.
Min Cao noted that the automotive sector will soon adopt 3nm and 5nm chips, and TSMC will be able to support the advancement of autonomous driving. He estimated that the semiconductor market will reach a scale of USD 1 trillion by 2030.
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(Photo credit: TSMC)
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On June 18th, Belgium’s microelectronics research center IMEC showcased the first CMOS CFET device featuring stacked bottom and top source/drain contacts at the 2024 IEEE VLSI Technology and Circuits Symposium (2024 VLSI). Although the results were achieved using front-side lithography techniques for both contacts, imec also demonstrated the feasibility of transferring the bottom contacts to the back side of the wafer, which potentially increases the survival rate of top devices from 11% to 79%.
IMEC explained that their logic technology roadmap envisions the introduction of Complementary Field-Effect Transistor (CFET) technology into device architectures at the A7 node. Paired with advanced wiring technologies, CFET is expected to reduce the standard cell height from 5T to 4T or even lower without sacrificing performance. Among the different approaches to integrating vertically stacked nMOS and pMOS structures, monolithic integration is considered the least disruptive compared to existing nanosheet process flows.
At VLSI Symposium 2024, IMEC demonstrated for the first time a functional monolithic CMOS CFET device with both top and bottom contacts. The device features a gate length of 18nm, a gate pitch of 60nm, and a vertical distance of 50nm between the n-type and p-type. The process flow IMEC’s proposed includes two CFET-specific modules: Middle Dielectric Isolation (MDI) and stacked bottom and top contacts.
MDI is a module pioneered by IMEC to isolate the top and bottom gates and to differentiate threshold voltage settings between n-type and p-type devices. Based on modifications to the “active” multilayer Si/SiGe stack in CFET, MDI module allows for the co-integration of internal spacers—a feature unique to nanosheets that isolates the gate from the source/drain.
“We obtained the best results in terms of process control with an MDI-first approach, i.e., before source/drain recess – the step where nanosheets and MDI are ‘cleaved’ to gain access to the channel sidewalls and start source/drain epi. An innovative source/drain recess etch with ‘in-situ capping’ enables MDI-first by protecting the gate hardmask/gate spacer during the source/drain recess.” stated Naoto Horiguchi, IMEC’s CMOS device technology director, as per a report from IMEC.
The second critical module is the formation of stacked source/drain bottom and top contacts, vertically separated by dielectric isolation. Key steps involve bottom contact metal filling and etching, followed by dielectric filling and etching—all completed within the confined space of the MDI stack.
Naoto Horiguchi noted that developing bottom contacts from the front side encountered many challenges, which potentially impacts bottom contact resistance and limits the process window for top devices. At VLSI 2024, IMEC indicated that despite additional processes like wafer bonding and thinning, this design is proved feasible, making the backside bottom contact structure an attractive option for the industry. Currently, research is underway to determine the optimal contact wiring method.
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(Photo credit: IMEC)
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Kevin Zhang, Senior Vice President of Business Development at TSMC, introduced the company’s latest technologies at the International Solid-State Circuits Conference (ISSCC) 2024. According to TechNews citing from the speech, Zhang shared insights into future technological advancements, prospects for advanced processes, and the latest semiconductor technologies needed in various fields.
Zhang noted that since the introduction of ChatGPT and Wi-Fi 7, a lot of advanced semiconductor are required, as we are entering an accelerated growth period for semiconductor going forward.
In the automotive sector, the industry is undergoing a revolution, with many suggesting that new vehicles will be software-defined. However, Zhang believes it’s more about silicon-defined because software needs to run on silicon, driving the future of autonomous driving capabilities.
CFET (Complementary Field-Effect Transistor)
In terms of technology, Transistor remain at the heart of the innovation, silicon innovation. It has shifted from geometry reduction to architectural innovation and the use of new materials. Moving from 16-nanometer FinFET to today’s 2-nanometer Nano Sheet technology represents significant progress in high-performance computing and architectural innovation.
What’s next? The answer is CFET.
Kevin Zhang explained that CFET involves stacking nMOS and pMOS on top of each other, significantly improving component currents and increasing transistor density by 1.5 to 2 times.
Alternatively, efforts are being made to create higher-performance switching devices from low-dimensional materials such as 2D materials, surpassing today’s devices or transistors.
Kevin Zhang also showcased that TSMC has successfully fabricated CFET architectures in the laboratory, stating, “This is a real integrated device that has been fabricated in our lab. Here, you see the transistor IV curve. They are beautiful curves. So, this is a significant milestone in terms of continuing to drive the innovation of the transistor architecture.”
However, as the geometry of the transistor shrinks, it becomes increasingly difficult and costly. This necessitates collaboration between process development teams and design research to achieve optimal benefits, known as “Design-Technology Co-Optimization” (DTCO).
In addition, TSMC has introduced FINFLEX technology, enabling chip designers to choose and mix the best fin structures to support each critical functional block, achieving optimal performance, density, and power consumption.
Another example of DTCO is Static Random Access Memory (SRAM). SRAM has scaled from 130 nanometers to the current 3 nanometers, and TSMC has achieved a over 100x density improvement, a result of collaboration or combination of a process innovation and adoption of the more advanced design technique.
Nevertheless, the essence or the objective of this technology scaling is for “energy efficient compute,” as Kevin Zhang expressed. He stated that in the entire semiconductor industry, TSMC has come a long way, and this progress has made today’s AI possible.
Whether it’s GPUs, TPUs, or customized ASICs, they all feature this particular integration scheme. Currently, the mainstream is 2.5D packaging. However, to meet future high-performance computing demands, this platform needs significant enhancement, requiring higher density and lower power consumption computation.
Therefore, stacking is needed, including integrating many memory bandwidths and HBM into the package, while considering issues such as power supply, I/O, and interconnect density.
Consequently, Kevin Zhang stated that bringing “silicon photonics into packaging” is the future direction. However, this will face many challenges, such as Co-Packaged Optics (CPO) closer to the electronic side.
1. 3D Stacking
When it comes to 3D stacking, Kevin Zhang presented a diagram and explained that to achieve higher interconnect density, specifically Chip-to-Chip connections, 3D stacking allows the bonding pitch to scale to just a few micrometers, achieving interconnect density like monolithic. “That’s why the 3D (stacking) is the future,” he concluded.
2. Silicon Photonics / Co-Packaged Optics (CPO)
Kevin Zhang pointed out that while electronics excel at computation, photons are better for signaling or communication. He illustrated that if a 50 terabyte switch, an all-electronic copper system were used, it would consume 2,400 W.
The current solution involves using pluggable modules, which can save 40% of power (> 1500W). However, as the need for higher-speed signals and larger bandwidths increases in the future, this solution falls short. Therefore, integrating silicon photonics technology is necessary to introduce photon capabilities.
Fundamentally, the latest automotive technologies require significant computational power, but power consumption is becoming a concern, especially for battery-powered vehicles.
Kevin Zhang states that automotive semiconductor technology has lagged behind consumer or HPC technologies by several generations due to stringent safety requirements. The DPPM (Defects Per Million) for automotive applications must be close to zero.
Therefore, fabs, semiconductor manufacturers, and automotive designers must collaborate more closely to accelerate this pace. He also promises, “you will see 3 nanometer in your car before long.”
As automotive transitions to a domain architecture, MCUs (Microcontroller Units) become increasingly important and require advanced semiconductor technology to provide computational capabilities.
Traditional MCUs mostly rely on floating-gate technology, but this technology encounters bottlenecks below 28 nanometers. Fortunately, the industry has invested in new memory technologies, including new non-volatile memories such as Magnetic Random Access Memory (MRAM) or Resistive Random Access Memory (RRAM).
Therefore, transitioning from MCU to MRAM or RRAM-based technologies helps drive continuous technology scaling from 28 nanometers to 16 nanometers, or even 7 nanometers.
Sensor technology has evolved from simple 2D designs and single layer design to intelligent systems with 3D wafer stacking, essentially layering the signal processing on top of the sensing layer.
Kevin Zhang also mentioned, “our technologies already start investing, researching on the multi-layer design.”
Engaging in three or more layer designs allows for the optimization of pixels, continuing the trend of scaling pixel sizes while meeting resolution requirements and achieving optimal sensing capabilities simultaneously.
Another example is AR (Augmented Reality) and VR (Virtual Reality), where separating memory layers and stacking them onto other logic chips can effectively reduce size while maintaining high-performance demands.
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(Photo credit: TSMC)